Current-Mode Sense Amplifier

ABSTRACT

A current sense amplifier is provided. The amplifier comprises a first cross coupled inverter, a second cross coupled inverter, and a transmission gate. The first cross coupled inverter has a first source coupled to sense current input. The second cross coupled inverter has a second source coupled to a reference current input. The transmission gate comprises a first transmission end, a second transmission end, and a gate input. The first transmission end is operatively coupled to a first input of the first cross coupled inverter. The second transmission end is operatively coupled to a second input of the second cross coupled inverter. The gate input is operatively coupled to the control line input. Each cross coupled inverter is configured for switching a coupling of the sense current input and the reference current input.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation patent application claiming thebenefit of the U.S. patent application Ser. No. 15/653,782, filed onJul. 19, 2017, and titled “Current-Mode Sense Amplifier” now pending,which is a continuation of Ser. No. 15/245,668, filed on Aug. 24, 2016,and titled “Current-Mode Sense Amplifier” now U.S. Pat. No. 9,761,286,which is a continuation patent application claiming the benefit of theU.S. patent application Ser. No. 14/840,134, filed on Aug. 31, 2015, andtitled “Current-Mode Sense Amplifier” now U.S. Pat. No. 9,552,851, whichclaims priority under 35 U.S.C. § 119 from Great Britain PatentApplication No. 1415668.1 filed on Sep. 4, 2014, the entire contents ofthe applications are incorporated herein by reference.

BACKGROUND

Several techniques may be implemented to read data in a memory cell. Forinstance a current sense amplifier may be used for reading the datastored in the memory cell. In this regard, the current sense amplifiermay compare a cell current to a reference current. The reference currentmay be a current of a reference memory cell. When the memory cell iscoupled to the current sense amplifier via a bit line it causes twodifferent currents flowing in the bit line depending on a logical value(“0” or “1”) stored in the memory cell. Based on comparison of thecurrent in the bit line against the reference current the current senseamplifier determines the logical value stored in the memory cell. Thechoice of current sense amplifiers for reading data stored in the memorycells is determined by the fact that the bit lines have highcapacitance. Thus evaluation of currents flowing in the bit linesenables faster operation of digital circuitry in comparison with thecase when evaluation of voltages is used for reading of data stored inthe memory cells.

SUMMARY

The present embodiments include current sense amplifiers and anelectronic circuit comprising static memory cells and the current senseamplifier.

In one aspect, a current sense amplifier is provided. More specifically,the amplifier comprises a first cross coupled inverter coupled to asense current input terminal, a second cross coupled inverter coupled toa reference current input terminal, a first amplifier output terminalcoupled to the first cross coupled inverter, a second amplifier outputterminal coupled to the second cross coupled inverter, and a controlline input terminal coupled to the first cross coupled inverter and thesecond cross coupled inverter. The control line input shifts the firstand second cross coupled inverters between states, e.g. from anunlatched state to a latched state. In the latched state, the firstcross coupled inverter measures current transmitted through the sensecurrent input terminal, the second cross coupled inverter measurescurrent transmitted through the reference current input terminal, andthe first and second cross coupled inverters compare the two currents.More specifically, the current comparison generates a first output atthe first amplifier output terminal, and an inverted second output atthe second amplifier output terminal.

In another aspect, an electronic circuit is provided comprising staticmemory cell(s) and a current sense amplifier. More specifically, theamplifier comprises a first cross coupled inverter, a second crosscoupled inverter, first and second amplifier output terminals, and acontrol line input terminal. The control line input shifts the first andsecond cross coupled inverters between states, e.g. from an unlatchedstate to a latched state. In the latched state, the first cross coupledinverter measures current transmitted through the sense current inputterminal, the second cross coupled inverter measures current transmittedthrough the reference current input terminal, and the first and secondcross coupled inverters compare the two currents. More specifically, thecurrent comparison generates a first output at the first amplifieroutput terminal, and an inverted second output at the second amplifieroutput terminal. The electronic circuit includes at least one staticmemory cell comprising first data output operatively coupled to thecurrent sense amplifier. The first data output is configured to outputdata stored in a respective memory cell.

These and other features and advantages will become apparent from thefollowing detailed description of the presently preferred embodiment(s),taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS

The drawings referenced herein form a part of the specification.Features shown in the drawings are meant as illustrative of only someembodiments, and not of all embodiments unless otherwise explicitlyindicated.

FIG. 1 is a block diagram depicting a circuit diagram of a current senseamplifier;

FIG. 2 is a timing diagram associated with a current sense amplifier;

FIG. 3 is a block diagram depicting a truth table associated with acurrent sense amplifier;

FIG. 4 is a circuit diagram depicting an electronic circuit comprisingmemory cells and a current sense amplifier;

FIG. 5 is a circuit diagram depicting an electronic circuit comprisingmemory cells and a current sense amplifier;

FIG. 6 is a circuit diagram depicting an electronic circuit comprisingmemory cells and a current sense amplifier;

FIG. 7 is a flow diagram depicting a design process used insemiconductor design, manufacture, and/or test.

DETAILED DESCRIPTION

It will be readily understood that the components of the embodiments, asgenerally described and illustrated in the Figures herein, may bearranged and designed in a wide variety of different configurations.Thus, the following detailed description of the embodiments of theapparatus, system, and method of the embodiments, as presented in theFigures, is not intended to limit the scope of the embodiments, asclaimed, but is merely representative of selected embodiments.

Reference throughout this specification to “a select embodiment,” “oneembodiment,” or “an embodiment” means that a particular feature,structure, or characteristic described in connection with the embodimentis included in at least one embodiment. Thus, appearances of the phrases“a select embodiment,” “in one embodiment,” or “in an embodiment” invarious places throughout this specification are not necessarilyreferring to the same embodiment.

The illustrated embodiments will be best understood by reference to thedrawings, wherein like parts are designated by like numerals throughout.The following description is intended only by way of example, and simplyillustrates certain selected embodiments of devices, systems, andprocesses that are consistent with the embodiments as claimed herein.

Reduction of power consumption and increase in clock frequency areeverlasting objectives of digital circuitry development. Achieving thisobjective comprises solving numerous optimization problems likereduction in peak power consumption and in overall power consumption,reduction of cross-talk between different nodes of circuitry, etc. Acurrent sense amplifier based on a pair of cross-coupled inverters maycomprise a current source configured to generate different referencecurrents. Configuration of the amplifier and coupling circuits (like,for instance, n-FET stacks) enables current limitation in both cases“match” and “mismatch”, i.e. when the reference current is lower thanthe sense current (“mismatch” case) and when the reference current ishigher than the sense current (“match” case). The amplifier may beconfigured in a way that no DC currents, except the leakage currents,are flowing through the amplifier in a steady state. Nodes (inputterminals, output terminals) of the amplifier may be decoupled from eachother, and, as a result, cross-talk between them is reduced.

In another embodiment, a gate terminal is configured for on/offswitching of a coupling between the transmission terminals of thetransmission gate. This feature may enable an effective way to drive thecross-coupled inverters out of steady latched state in order to preparethe amplifier for a sensing phase, when the reference and the sensecurrent are compared. Implementation of this feature is anotheradvantage of the amplifier, because the transmission gate may beimplemented just by a single transistor.

In another embodiment, the input terminal of the first NAND gate coupledto the control line is coupled to the control line via a furtherinverter. This feature may prevent a situation in which the output valueis undefined at the output terminal of the NAND gate (output terminal ofthe amplifier), when the amplifier is brought out of steady state. Thismechanism will be discussed in greater detail further on below.

In another embodiment, the amplifier comprises a second NAND gate andanother output terminal. An output terminal of the second NAND gate iscoupled to the other output terminal of the amplifier. One of the inputterminals of the second NAND gate is coupled to the to the control lineand the other input terminal of the second NAND gate is coupled to theinput terminal of the inverter comprising the n-FET having the sourcecoupled to the reference current input terminal. The input terminal ofthe first NAND gate is coupled to the input terminal of the invertercomprising the n-FET having the source coupled to the sense currentinput terminal. This embodiment relates to a further advantageousfeature of the amplifier which may enable generating a logical value atthe second output terminal being logically complimentary of a logicalvalue at the first output terminal when in the sense phase logicalvalues corresponding to either “mismatch” case or “match” case aregenerated at the output terminals of the amplifier.

In another embodiment, the input terminal of the second NAND gatecoupled to the control line is coupled to the control line via thefurther inverter. This feature may prevent a situation in which anoutput value is undefined at the output terminal of the second NAND gate(second output terminal of the amplifier), when the amplifier is broughtout of steady state. This mechanism will be discussed in greater detailfurther on in the text.

In another embodiment, the reference current input terminal is coupledto a reference current source. The advantage of this feature may be thata reference current source may be implemented in a numerous ways. Forinstance it may be implemented by employing the reference current sourceas a single transistor. This feature may enable a pseudo single-endedcurrent sensing scheme where the reference current source provides thesecond current required for the differential amplifier. In anotherembodiment, the reference current source is a programmable currentsource. The feature may enable tuning of performance the amplifier afterit has been manufactured. This tuning functionality enables achievingultimate performance by compensating variation of electrical propertiesof transistors over a wafer and/or from wafer to wafer.

In another embodiment, the sense current input terminal is coupled to afurther n-FET being configured for on/off switching of a coupling of thesense current input terminal to a ground terminal. This feature mayenable more stable operation of the amplifier. The input sense terminalmay be coupled to the ground when the cross-coupled inverters arelatched. The grounding may enable suppression of parasitic voltagedrifts at the sense current input terminal. The grounding may furtherprovide an effective resetting the sense current input terminal to apredefined state in a way that every next operation cycle is notaffected by one or more previous operation cycles. In anotherembodiment, the further n-FET is comprised in a further transmissiongate.

In another embodiment, each of the static memory cells comprises a firstdata output terminal for outputting data stored in the respective staticmemory cell. The first data output terminal of each the static memorycells is coupled to the sense current input terminal.

In another embodiment, each first data output terminal of the staticmemory cells is coupled via a respective first n-FET stack to the sensecurrent input terminal. In another embodiment, the first n-FET stacksare connected in a parallel arrangement to ground and the sense currentinput terminal. Each of the first data output terminals is coupled to agate of one of the n-FET transistors of the respective first n-FETstacks.

In another embodiment, the reference current input terminal is coupledto a current source configured to generate a current being bigger thanzero and lower than a lowest of grounding currents with respect to thefirst n-FET stacks. The grounding current of an individual first n-FETstack is given by the current that is flowing through the first n-FETstack when all of its transistors are open. This embodiment may enablethe operation of the amplifier within a large process parameter space.

In another embodiment, the reference current input terminal is coupledto a current source configured to generate a current being bigger thanzero a maximum of a sum of the leakage currents of all first n-FETstacks and lower than a lowest of grounding currents with respect to thefirst n-FET stacks. The grounding current of an individual first n-FETstack is given by the current that is flowing through the first n-FETstack when all of its transistors are open. A leakage current of anindividual first n-FET stack is given by the current that is flowingthrough the first n-FET stack when at least one of its transistors isclosed. This embodiment may enable the operation of the amplifier withina large process parameter space.

In another embodiment each first data output terminal of the staticmemory cells is further coupled via a respective second n-FET stack tothe sense current input terminal. The second n-FET stacks are connectedin a parallel arrangement to ground and the sense current inputterminal. Each of the first data output terminals is further coupled toa gate of one of the n-FET transistors of the second respective n-FETstacks via a respective inverter. The reference current input terminalis coupled to a current source configured to generate a current beingbigger than zero and less than a lowest of grounding currents withrespect to the first and second n-FET stacks. The grounding current ofan individual first or second n-FET stack is given by the current thatis flowing through the first or second n-FET stack when all of itstransistors are open. This embodiment may provide for anotherconfiguration of coupling of memory cells to the current sense inputterminal enable the operation of the amplifier within a large processparameter space.

In another embodiment, each first data output terminal of the staticmemory cells is further coupled via a respective second n-FET stack tothe sense current input terminal. The second n-FET stacks are connectedin a parallel arrangement to ground and the sense current inputterminal. Each of the first data output terminals is further coupled toa gate of one of the n-FET transistors of the second respective n-FETstacks via a respective inverter. The reference current input terminalis coupled to a current source configured to generate a current beingbigger than a maximum of a sum of the leakage currents of all the secondn-FET stacks connected to this terminal and less than a lowest ofgrounding currents with respect to the first and second n-FET stacks.The grounding current of an individual first or second n-FET stack isgiven by the current that is flowing through the first or second n-FETstack when all of its transistors are open. A leakage current of anindividual first n-FET stack is given by the current that is flowingthrough the first n-FET stack when at least one of its transistors isclosed. This embodiment may provide for another configuration ofcoupling of memory cells to the current sense input terminal enable theoperation of the amplifier within a large process parameter space.

In an another embodiment, the first and the second current inputterminals are coupled to further n-FETs each being configured for on/offswitching of a coupling of the first and the second current inputterminal, respectively. This feature may enable more stable operation ofthe amplifier. The first input terminal and/or the second input terminalmay be coupled to the ground when the cross-coupled inverters arelatched. The grounding may enable suppression of parasitic voltagedrifts at the first and/or second current input terminal. The groundingmay further provide an effective resetting the sense current inputterminal to a predefined state in a way that every next operation cycleis not affected by one or more previous operation cycles.

FIG. 1 illustrates a circuit diagram of a current sense amplifier (103).The current sense amplifier comprises a reference current input terminal(109), a control line input terminal (125), a sense current inputterminal, (108), an output terminal (106), an output terminal (107), afirst NAND gate (100), a second NAND gate (101), an inverter (102), atransmission gate (104), and two cross coupled inverters (T1), (T2);(T3), (T4). One of the cross coupled inverters is based on p-FET T1 andn-FET T2. Another one of the cross coupled inverters is based on p-FET(T3) and n-FET (T4). The sources of the n-FETs (T2) and (T4) are coupledto the sense current input terminal (108) and the reference currentinput terminal (109), respectively.

The transmission gate (104) comprises two transmission terminals and agate terminal. The gate terminal is coupled to the control lineterminal. The gate terminal of the transmission gate is identical to thegate terminal of the n-FET comprised in the transmission gate. The gateterminal of the p-FET comprised in the transmission gate is coupled tothe inverted control line terminal (not shown in FIG. 1).

In an alternative implementation the “transmission gate” may onlycomprise 1 single n-FET or 1 single p-FET coupled the same as in thefull transmission gate described above.

Alternatively the amplifier may comprise only one of the twoaforementioned NAND gates and only one of the output terminals (106) and(107).

One of the transmission terminals is coupled to an input terminal of oneof the inverters and the other transmission terminal is coupled to aninput terminal of the other inverter, i.e. one of the transmissionterminals is coupled to gates of the transistors (T1) and (T2) (input ofone of the cross coupled inverters) and drains of transistors (T3) and(T4) (output of another one of the cross coupled inverters), another oneof the transmission terminals is coupled to gates of the transistors(T3) and (T4) (input of the one of the cross coupled inverters) anddrains of transistors (T1) and (T2) (output of the other one of thecross coupled inverters). Sources of the transistors (T1) and (T3) arecoupled to power terminal VDD (105).

One input of the NAND gate (100) is coupled via node TRU (114) to theoutput of the inverter comprising transistors (T3) and (T4). Anotherinput of the NAND gate (100) is coupled to an output of the inverter(102). One input of the NAND gate (101) is coupled via node CMP (113) tothe output of the inverter comprising transistors (T1) and (T2). Anotherinput of the NAND gate (101) is coupled to an output of the inverter(102). An output terminal of the NAND gate is coupled to the outputterminal (106). An output terminal of the NAND gate (101) is coupled tothe output terminal (107).

An input of the inverter (102) is coupled to the control line inputterminal (125). The sense current input terminal (108) may be furthercoupled to ground terminal VSS 111 via n-FET transistor (T5) or viaanother transmission gate comprising the transistor (T5).

A drain of the transistor (T5) (one transmission terminal of the anothertransmission gate) is coupled to the sense current input terminal and asource of the transistor (T5) (another transmission terminal of theanother transmission gate) is coupled to the ground terminal VSS (111).A gate of the transistor (T5) (a gate of the another transmission gate)is coupled to a reset input terminal (112).

The reference current input terminal is coupled to ground terminal VSS(111) via a current source (110). One output terminal of the currentsource (110) is coupled to the reference current input terminal (109)and the other output terminal of the current source is coupled to theground terminal VSS (111). The sense current input terminal may be usedfor coupling of memory cells to it. The memory cells may be coupled tothe sense input current terminal via respective n-FET stacks each. Thecurrent sense amplifier is configured to generate a logical value on theoutput terminal (106) and the logical value in an inverted form on theoutput terminal (107) when an electrical current flowing through thereference current input terminal is higher than an electrical currentflowing through the sense current input terminal.

The current sense amplifier is further configured to generate thelogical value on the output terminal (107) and the logical value in aninverted form on the output terminal (106) when an electrical currentflowing through the reference current input terminal is lower than anelectrical current flowing through the sense current input terminal.

The current source (110) may be a fixed current source based on a singleFET transistor. Alternatively the current source (110) may be aprogrammable current source. For instance, the programmable currentsource may be implemented using a current mirror scheme.

The functioning of the amplifier depicted in FIG. 1 is illustrated inFIG. 2 and in FIG. 3. FIG. 2 is a timing diagram associated with theamplifier and FIG. 3 depicts a truth table of the amplifier. FIG. 2illustrates time dependencies of voltages at following terminals andnodes being synchronized with a clock signal (GCKN trace in FIG. 2): thereset input terminal (112) (RESET (112) trace in FIG. 2), the controlline input terminal (125) (IN (125) trace in FIG. 2), the TRU (114) node(TRU (144) trace in FIG. 2), the CMP node (113) (CMP (113) trace in FIG.2), the output terminal (106) (OUT_1 (106) trace in FIG. 2), and theoutput terminal (107) (OUT_2 trace in FIG. 2).

The operation of the amplifier comprises two phases 1 and 2. In phase 1a voltage at the control line input terminal is high (logical value“1”). This voltage causes the inverter (102) to generate low voltage(logical value “0”) at the input terminals of the NAND gates (100) and(101) coupled to the output terminal of the inverter (102). As a resultthereof both of the NAND gates (101) and (101) generate high voltages(logical value “1”) and their output terminals. The high voltage at thecontrol line input terminal causes the transmission gate (104) to coupleits transmission terminals. As a result thereof the cross coupledinverters are driven out of a latch state, i.e. voltages at the nodes(113) and (114) are equal and may not correspond to either logical value“0” or logical value “1”.

However this uncertainty does not affect performance of digitalcircuitry coupled to the output terminals (106) and (107) because bothof the NAND gates (100) and (101) have on their input terminals coupledto the output terminal of the inverter (102) the low voltagecorresponding to a logical value “0” and thus the output terminals ofNAND gates (100) and (101) are driven to the high voltage correspondingto a logical “1” independent of the voltage levels of nodes CMP (113)and TRU (114). This case corresponds to a row “PHASE 1” of the truthtable in the FIG. 3. The logical values of the TRU and CMP nodes are notfilled in in this row because the logical values at these nodes are notdefined in the phase 1.

In phase 2, a comparison of a reference current flowing through thereference current input terminal (109) and a sense current flowingthrough sense current input terminal (108). FIG. 2 depicts a match casewhen the sense current is current is lower than the reference current.In this case a current flowing through the transistors (T3) and (T4) ishigher than a current flowing through the transistors (T2) and (T1),i.e. the node TRU (114) is pulled down stronger than the node CMP (113).As a result thereof the cross coupled transistors are driven into alatched state, wherein a low voltage corresponding to logical value “0”is established on the node TRU (114) and the corresponding inputterminal of the NAND gate (100) and a high voltage corresponding tological value “1” is established on the node CMP (113) and thecorresponding input terminal of the NAND gate (101).

In the phase 2 a voltage at the control line input terminal is low(logical value “0”). This voltage causes the inverter (102) to generatehigh voltage (logical value “1”) at the input terminals of the NANDgates (100) and (101) coupled to the output terminal of the inverter(102). These logical values at the input terminals of the NAND gates(100) and (101) cause generation of logical values “1” and “0” at theoutput terminals of the NAND gates (100),(101) and output terminals(106), (107), respectively. This case is illustrated in a row “PHASE 2MATCH” of the Table depicted on FIG. 3.

The phase 2 may further comprise a reset pulse causing the transistor T5(or the transmission gate comprising the transistor T5) to couple thesense current input terminal (108) to the ground terminal VSS (111). Thereset pulse is generated in a time interval RES depicted on the FIG. 2.This coupling is performed only after the cross coupled inverters aredriven into a latched state. In this case the logical values on theoutput terminals are not disturbed.

A row “PHASE 2 MISS” in the Table depicted on FIG. 3 corresponds to amismatch case of phase 2 when a reference current flowing through thereference current input terminal (109) is lower than a sense currentflowing through sense current input terminal (108). In this case acurrent flowing through the transistors (T3) and (T4) is lower than acurrent flowing through the transistors (T2) and (T1), i.e. the node CMP(113) is pulled down stronger than the node TRU (114). As a resultthereof the cross coupled transistors are driven into a latched state,wherein a low voltage corresponding to logical value “0” is establishedon the node CMP (113) and the corresponding input terminal of the NANDgate (101) and a high voltage corresponding to logical value “1” isestablished on the node TRU (114) and the corresponding input terminalof the NAND gate (100).

In the phase 2 a voltage at the control line input terminal is low(logical value “0”). This voltage causes the inverter (102) to generatehigh voltage (logical value “1”) at the input terminals of the NANDgates (100) and (101) coupled to the output terminal of the inverter(102). These logical values at the input terminals of the NAND gates(100) and (101) cause generation of logical values “0” and “1” at theoutput terminals of the NAND gates (100),(101) and output terminals(106), (107), respectively.

The amplifier (103) has a number of distinctive advantages. The resultof the comparison between the reference current and the sense current islatched, i.e. no specific synchronization is needed for reading datagenerated by the amplifier. The sense and reference currents are alwayslimited by the electrical resistances of the respective pairs oftransistors (T1), (T2) and (T3), (T4) connected in series

FIG. 4 illustrates an electronic circuitry comprising the amplifier(103). First output terminals (115A) of memory cells (115) areconfigured to output logical values stored in the memory cells. Thememory cells may be static memory cells. The static memory cells may bebut are not limited to six transistor memory cells, eight transistormemory cells, or pairs of cross coupled inverters. Each of the firstoutput terminals is configured to generate a high voltage correspondingto a logical value “1” when a logical value “1” is stored in the memorycell and to generate a low voltage corresponding to a logical value “0”when a logical value “0” is stored in the memory cell.

The first output terminals (115A) are coupled in parallel to the sensecurrent input terminal (108) via a respective first coupling circuitry,each. Each of the first coupling circuitries may be a single n-FETtransistor or a first stack of n-FET transistors and configured tocouple the sense current input terminal to a ground terminal VSS (111).

For instance the first coupling circuitry may be a single n-FETtransistor having a source coupled to the ground terminal VSS (111), adrain coupled to the sense current input terminal, and a gate coupled tothe first output terminal (115A) of the respective memory cell (115).

The n-FET transistor is configured to transit in an open state, when thehigh voltage is generated at the first output terminal of the respectivememory cell, and transit into a closed state, when the low voltage isgenerated at the first output terminal of the respective memory cell.The n-FET transistors may be comprised into a respective n-FET firststack (116), each. The n-FET first stacks may comprise additional n-FETtransistors coupled in series.

FIG. 4 depicts an example case when each of the n-FET first stacks (116)comprises two n-FET transistors connected in series. A gate of one ofthe transistors of each of the first stacks (116) is coupled the firstoutput terminal (115A) of the respective memory cell (115). A gate ofanother transistor of each of the first stacks (116) is coupled to arespective select line (118). The select lines (118) may be used formasking the data stored in one or more of the memory cells duringevaluation of data stored in the one or more of the memory cells (phase2).

The configuration of circuitry depicted on FIG. 4 may imply criteria ona choice of a value of the reference current generated by the currentgenerator (110) in the phase 2. The current generator has to generate anelectrical current being lower than any of the currents flowing throughthe sense current input terminal when at least one of the first couplingcircuitries couples the sense current input terminal to the groundterminal.

Turning back to the example depicted on FIG. 4 the reference current hasto be lower than any of currents flowing though one of the n-FET firststacks when all transistors of the n-FET first stack are open. On theother hand the current generator has to generate the reference currenthigher than a parasitic current flowing through the sense current inputterminal when any of the first coupling circuitries do not couple thesense current input terminal to the ground terminal. The parasiticcurrent may be caused by a leakage current of a wiring (117) couplingthe first coupling circuitries to the sense current input terminal (108)and/or by parasitic leakage currents of the first coupling circuitsthemselves.

The aforementioned interval for an allowable reference current may befurther reduced by selecting a sub-interval within it as an interval forthe allowable reference current. For instance the sub-interval may bereduced to 50% of the aforementioned interval. It may be a lower, top,or central part of the aforementioned interval.

FIG. 5 illustrates another electronic circuitry comprising the amplifier(103). In comparison with the electronic circuitry depicted in the FIG.4 the first output terminals (115A) of the memory cells (115) arefurther coupled via respective inverters (119) and second couplingcircuitries (120) to the current sense input terminal, each. The inputterminals of the inverters are coupled to the respective first outputterminals of the memory cells. The first output terminals of theinverters (119) are coupled to the sense current input terminal via therespective second coupling circuits (120), each.

The functioning of the second coupling circuits (120) is the same as thefunctioning of the first coupling circuits. Each second coupling circuitmay comprise one n-FET transistor or a second stack of n-FETtransistors. One of n-FET transistors of each of the second couplingcircuits is coupled to the first output terminal of the respectiveinverter (119). In case when the second coupling circuitry comprises thesecond n-FET stack, each, a gate of one of transistors of the secondn-FET stacks (120) may be coupled to a respective word line (126) asdepicted on the FIG. 5.

The select lines (126) may be used for masking data stored in one ormore of the memory cells (115) during evaluation of data stored in theone or more memory cells (phase 2). The interval of allowable referencecurrents may be determined in a similar way as for the electroniccircuitry depicted on the FIG. 4, wherein currents flowing through thesecond coupling circuits are taken in account as well.

FIG. 6 illustrates yet another electronic circuitry comprising theamplifier (103). In addition to the memory cells of the electroniccircuitries depicted on FIG. 4 and FIG. 5 the memory cells (115)depicted on the FIG. 6 have further second output terminals (115B). Thesecond output terminals are configured to output data stored in thememory cells in an inverted form. For instance, if a logical value “1”is stored in the memory cell (115), then a logical value “1” isgenerated on the first output terminal (115A) and a logical value “0” isgenerated on the second output terminal (115B).

Each of the first output terminals (115A) are coupled via a respectivetransistor to a bit line (124). Each of the first output terminals(115B) are coupled via a respective transistor to a bit line (125).Gates of pairs of transistors coupling the first and the second outputterminals of each of the memory cells to the respective bit lines arecoupled to a respective select line (123). The bit line (124) is coupledto the first input terminal (108) of the amplifier (103). The bit line(125) is coupled to the second input terminal (109) of the amplifier.

The first input terminal (108) of the amplifier depicted on the FIG. 6is the sense current input terminal (108) of the amplifier (103)depicted on the FIG. 1. The second input terminal (108) of the amplifierdepicted on the FIG. 6 is the reference current input terminal (108) ofthe amplifier (103) depicted on the FIG. 1.

Instead of using the reference current generator a complimentary logicsignal at the second input terminal (109) is used. For instance if alogical value “1” is stored in the memory cell and the respective selectline is activated for coupling of the first (115A) and the second (115B)output terminal to the first (108) and second (109) input terminal, thefirst input terminal is coupled the first output terminal being coupledto power terminal VDD (logical value “1”) and the second input terminalis coupled to the second output terminal being coupled to groundterminal VSS (logical value “0”).

As a result thereof, an electrical current flowing through the secondinput terminal is higher than an electrical current flowing through thefirst input terminal. The amplifier (103) can compare these electricalcurrents and evaluate the logical value stored in the memory cell.

The electronic circuitry depicted on FIG. 6 may further comprise atleast one of reset transistors (T5) and (T6). Sources of (T5) and (T6)are coupled to a ground terminal VSS (111). A gate of (T5) is coupled toa terminal RESET (112A) and a gate of (T6) is coupled to a terminalRESET(112B). Terminals RESET (112A) and (112B) may be the same terminalsor different terminals. Drains of (T5) and (T6) are coupled to the first(108) and second (109) input terminal, respectively. Transistors (T5)and (T6) of the circuitry depicted on FIG. 6 have the same functionalityas transistor (T5) of the circuitry depicted on FIG. 1. Both oftransistors (T5) and (T6) depicted on FIG. 6 are open by (respective)reset pulse(s) in the phase two when the cross coupled inverters arelatched.

FIG. 7 is a flow diagram of a design process used in semiconductordesign, manufacture, and/or test. FIG. 7 shows a block diagram of anexemplary design flow (900) used for example, in semiconductor IC logicdesign, simulation, test, layout, and manufacture. Design flow (900)includes processes, machines and/or mechanisms for processing designstructures or devices to generate logically or otherwise functionallyequivalent representations of the design structures and/or devicesdescribed above and shown in FIGS. 1, 4, 5, 6.

The design structures processed and/or generated by design flow (900)may be encoded on machine-readable transmission or storage media toinclude data and/or instructions that when executed or otherwiseprocessed on a data processing system generate a logically,structurally, mechanically, or otherwise functionally equivalentrepresentation of hardware components, circuits, devices, or systems.Machines include, but are not limited to, any machine used in an ICdesign process, such as designing, manufacturing, or simulating acircuit, component, device, or system. For example, machines mayinclude: lithography machines, machines and/or equipment for generatingmasks (e.g. e-beam writers), computers or equipment for simulatingdesign structures, any apparatus used in the manufacturing or testprocess, or any machines for programming functionally equivalentrepresentations of the design structures into any medium (e.g. a machinefor programming a programmable gate array).

Design flow (900) may vary depending on the type of representation beingdesigned. For example, a design flow (900) for building an applicationspecific IC (ASIC) may differ from a design flow (900) for designing astandard component or from a design flow (900) for instantiating thedesign into a programmable array, for example a programmable gate array(PGA) or a field programmable gate array (FPGA) offered by Altera® Inc.or Xilinx® Inc.

FIG. 7 illustrates multiple such design structures including an inputdesign structure (920) that is preferably processed by a design process(910). Design structure (920) may be a logical simulation designstructure generated and processed by design process (910) to produce alogically equivalent functional representation of a hardware device.Design structure (920) may also or alternatively comprise data and/orprogram instructions that when processed by design process (910),generate a functional representation of the physical structure of ahardware device. Whether representing functional and/or structuraldesign features, design structure (920) may be generated usingelectronic computer-aided design (ECAD) such as implemented by a coredeveloper/designer.

When encoded on a machine-readable data transmission, gate array, orstorage medium, design structure (920) may be accessed and processed byone or more hardware and/or software modules within design process (910)to simulate or otherwise functionally represent an electronic component,circuit, electronic or logic module, apparatus, device, or system suchas this shown in FIGS. 1, 4, 5, 6. As such, design structure (920) maycomprise files or other data structures including human and/ormachine-readable source code, compiled structures, andcomputer-executable code structures that when processed by a design orsimulation data processing system, functionally simulate or otherwiserepresent circuits or other levels of hardware logic design. Such datastructures may include hardware-description language (HDL) designentities or other data structures conforming to and/or compatible withlower-level HDL design languages such as Verilog and VHDL, and/or higherlevel design languages such as C or C++.

Design process (910) preferably employs and incorporates hardware and/orsoftware modules for synthesizing, translating, or otherwise processinga design/simulation functional equivalent of the components, circuits,devices, or logic structure shown in FIGS. 1, 4, 5, 6 to generate anetlist (980) which may contain design structures such as designstructure (920). Netlist (980) may comprise, for example, compiled orotherwise processed data structures representing a list of wires,discrete components, logic gates, control circuits, I/O devices, models,etc. that describes the connections to other elements and circuits in anintegrated circuit design. Netlist (980) may be synthesized using aniterative process in which netlist (980) is resynthesized one or moretimes depending on design specifications and parameters for the device.

As with other design structure types described herein, netlist (980) maybe recorded on a machine-readable data storage medium or programmed intoa programmable gate array. The medium may be a non-volatile storagemedium such as a magnetic or optical disk drive, a programmable gatearray, a compact flash, or other flash memory. Additionally, or in thealternative, the medium may be a system or cache memory, buffer space,or electrically or optically conductive devices and materials on whichdata packets may be transmitted and intermediately stored via theInternet, or other networking suitable means.

Design process (910) may include hardware and software modules forprocessing a variety of input data structure types including netlist(980). Such data structure types may reside, for example, within libraryelements (930) and include a set of commonly used elements, circuits,and devices, including models, layouts, and symbolic representations,for a given manufacturing technology (e.g., different technology nodes,32 nm, 45 nm, 90 nm, etc.). The data structure types may further includedesign specifications (940), characterization data (950), verificationdata (960), design rules (970), and test data files (985) which mayinclude input test patterns, output test results, and other testinginformation.

Design process (910) may further include, for example, standardmechanical design processes such as stress analysis, thermal analysis,mechanical event simulation, process simulation for operations such ascasting, molding, and die press forming, etc. One of ordinary skill inthe art of mechanical design can appreciate the extent of possiblemechanical design tools and applications used in design process (910)without deviating from the scope and spirit of the embodiments. Designprocess (910) may also include modules for performing standard circuitdesign processes such as timing analysis, verification, design rulechecking, place and route operations, etc.

Design process (910) employs and incorporates logic and physical designtools such as HDL compilers and simulation model build tools to processdesign structure (920) together with some or all of the depictedsupporting data structures along with any additional mechanical designor data (if applicable), to generate a second design structure (990).

Design structure (990) resides on a storage medium or programmable gatearray in a data format used for the exchange of data of mechanicaldevices and structures (e.g. information stored in a IGES, DXF,Parasolid XT, JT, DRG, or any other suitable format for storing orrendering such mechanical design structures). Similar to designstructure (920), design structure (990) preferably comprises one or morefiles, data structures, or other computer-encoded data or instructionsthat reside on transmission or data storage media and that whenprocessed by an ECAD system generate a logically or otherwisefunctionally equivalent form of one or more of the embodiments shown inFIGS. 1, 4, 5, 6. In one embodiment, design structure (990) may comprisea compiled, executable HDL simulation model that functionally simulatesthe devices shown in FIGS. 1, 4, 5, 6.

Design structure (990) may also employ a data format used for theexchange of layout data of integrated circuits and/or symbolic dataformat (e.g. information stored in a GDSII (GDS2), GL1, OASIS, mapfiles, or any other suitable format for storing such design datastructures). Design structure (990) may comprise information such as,for example, symbolic data, map files, test data files, design contentfiles, manufacturing data, layout parameters, wires, levels of metal,vias, shapes, data for routing through the manufacturing line, and anyother data required by a manufacturer or other designer/developer toproduce a device or structure as described above and shown in FIGS. 1,4, 5, 6. Design structure (990) may then proceed to a stage (995) where,for example, design structure (990): proceeds to tape-out, is releasedto manufacturing, is released to a mask house, is sent to another designhouse, is sent back to the customer, etc.

The method as described above is used in the fabrication of integratedcircuit chips. The resulting integrated circuit chips can be distributedby the fabricator in raw wafer form (that is, as a single wafer that hasmultiple unpackaged chips), as a bare die, or in a packaged form. In thelatter case the chip is mounted in a single chip package (such as aplastic carrier, with leads that are affixed to a motherboard or otherhigher level carrier) or in a multichip package (such as a ceramiccarrier that has either or both surface interconnections or buriedinterconnections). In any case the chip is then integrated with otherchips, discrete circuit elements, and/or other signal processing devicesas part of either (a) an intermediate product, such as a motherboard, or(b) an end product. The end product can be any product that includesintegrated circuit chips, ranging from toys and other low-endapplications to advanced computer products having a display, a keyboardor other input device, and a central processor.

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting of the embodiments.As used herein, the singular forms “a”, “an” and “the” are intended toinclude the plural forms as well, unless the context clearly indicatesotherwise. It will be further understood that the terms “comprises”and/or “comprising,” when used in this specification, specify thepresence of stated features, integers, steps, operations, elements,and/or components, but do not preclude the presence or addition of oneor more other features, integers, steps, operations, elements,components, and/or groups thereof.

The corresponding structures, materials, acts, and equivalents of allmeans or step plus function elements in the claims, if applicable, areintended to include any structure, material, or act for performing thefunction in combination with other claimed elements as specificallyclaimed. The description of the embodiments has been presented forpurposes of illustration and description, but is not intended to beexhaustive or limited to the embodiments in the form disclosed. Manymodifications and variations will be apparent to those of ordinary skillin the art without departing from the scope and spirit of theembodiments. The embodiment was chosen and described in order to bestexplain the principals of the embodiments and the practical application,and to enable others of ordinary skill in the art to understand thevarious embodiments with various modifications as are suited to theparticular use contemplated. Accordingly, while the embodiments havebeen described in terms of embodiments, those of skill in the art willrecognize that the embodiments can be practiced with modifications andin the spirit and scope of the appended claims.

What is claimed is:
 1. A current sense amplifier comprising: a firstcross coupled inverter coupled to a sense current input terminal; asecond cross coupled inverter coupled to a reference current inputterminal; a first amplifier output terminal coupled to the first crosscoupled inverter; a second amplifier output terminal coupled to thesecond cross coupled inverter; and a control line input terminal coupledto the first cross coupled inverter and the second cross coupledinverter, the control line input to shift the first and second crosscoupled inverters from an unlatched state to a latched state, wherein inthe latched state: the first cross coupled inverter to measure currenttransmitted through the sense current input terminal; the second crosscoupled inverter to measure current transmitted through the referencecurrent input terminal; and the first and second cross coupled invertersto compare the two currents, the comparison of the currents generating afirst output at the first amplifier output terminal and an invertedsecond output at the second amplifier output terminal.
 2. The amplifierof claim 1, further comprising a transmission gate coupled to thecontrol line input terminal and the first and second cross coupledinverters.
 3. The amplifier of claim 2, wherein the transmission gatecomprises a first transmission terminal coupled to the first crosscoupled inverter and a second transmission terminal coupled to thesecond cross coupled inverter, the transmission gate terminalsconfigured for on/off switching of the couplings between thetransmission gate terminals and the associated cross coupled inverters.4. The amplifier of claim 1, wherein in the unlatched state the firstoutput at the first amplifier output terminal and the second output atthe second amplifier output terminal are equal.
 5. The amplifier ofclaim 1, further comprising: a first NAND gate coupled to the firstcross coupled inverter and the first amplifier output terminal; a secondNAND gate coupled to the second cross coupled inverter and the secondamplifier output terminal; and a control line inverter coupled to thecontrol line input terminal and the first and second NAND gates, whereinthe first and second NAND gates facilitate generating the outputs at thefirst and second amplifier output terminals at least partially as afunction of the control line input.
 6. The amplifier of claim 1, furthercomprising a reset device coupled to the sense current input terminal,the reset device to shift the first and second cross coupled invertersfrom the latched state to the unlatched state.
 7. The amplifier of claim1, wherein: the sense current input terminal is coupled to at least onememory cell of an electronic circuit operatively coupled to theamplifier; and the reference current input terminal is coupled to areference source.
 8. The amplifier of claim 1, wherein in the latchedstate, the outputs of the first and second amplifier output terminals atleast partially define the contents of the at least one memory cell. 9.An electronic circuit, comprising: a current sense amplifier comprising:a first cross coupled inverter coupled to a sense current inputterminal; a second cross coupled inverter coupled to a reference currentinput terminal; a first amplifier output terminal coupled to the firstcross coupled inverter; a second amplifier output terminal coupled tothe second cross coupled inverter; and a control line input terminalcoupled to the first cross coupled inverter and the second cross coupledinverter, the control line input to shift the first and second crosscoupled inverters from an unlatched state to a latched state, wherein inthe latched state: the first cross coupled inverter to measure currenttransmitted through the sense current input terminal; the second crosscoupled inverter to measure current transmitted through the referencecurrent input terminal; and the first and second cross coupled invertersto compare the two currents, the comparison of the currents generating afirst output at the first amplifier output terminal and an invertedsecond output at the second amplifier output terminal; and one or morestatic memory cells, each of the static memory cells comprising a firstdata output operatively coupled to the current sense amplifier, eachfirst data output configured for outputting data stored in therespective memory cell.
 10. The electronic circuit of claim 9, whereinthe current sense amplifier further comprising a transmission gatecoupled to the control line input terminal and the first and secondcross coupled inverters.
 11. The electronic circuit of claim 10, whereinthe transmission gate comprises a first transmission terminal coupled tothe first cross coupled inverter and a second transmission terminalcoupled to the second cross coupled inverter, the transmission gateterminals configured for on/off switching of the couplings between thetransmission gate terminals and the associated cross coupled inverters.12. The electronic circuit of claim 9, wherein in the unlatched statethe first output at the first amplifier output terminal and the secondoutput at the second amplifier output terminal are equal.
 13. Theelectronic circuit of claim 9, wherein the current sense amplifierfurther comprising: a first NAND gate coupled to the first cross coupledinverter and the first amplifier output terminal; a second NAND gatecoupled to the second cross coupled inverter and the second amplifieroutput terminal; and a control line inverter coupled to the control lineinput terminal and the first and second NAND gates, wherein the firstand second NAND gates facilitate generating the outputs at the first andsecond amplifier output terminals at least partially as a function ofthe control line input.
 14. The electronic circuit of claim 9, whereinthe current sense amplifier further comprising a reset device coupled tothe sense current input terminal, the reset device to shift the firstand second cross coupled inverters from the latched state to theunlatched state.
 15. The electronic circuit of claim 9, wherein thereference current input terminal is coupled to a reference source. 16.The electronic circuit of claim 9, wherein in the latched state, theoutputs of the first and second amplifier output terminals at leastpartially define the contents of the one or more static memory cells.